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From contamination to defects, faults, and yield loss : simulation and applications /

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Bibliographic Details
Main Author: Khare, Jitendra B.
Other Authors: Maly, W.
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1996]
Series:Frontiers in electronic testing.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Defects.
Integrated circuits > Very large scale integration > Computer simulation.
Computer-aided design.
Integrated circuits > Testing
Description
Physical Description:150 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0792397142 (acid-free paper)