From contamination to defects, faults, and yield loss : simulation and applications /

Bibliographic Details
Main Author:	Khare, Jitendra B.
Other Authors:	Maly, W.
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [1996]
Series:	Frontiers in electronic testing.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Defects. Integrated circuits > Very large scale integration > Computer simulation. Computer-aided design. Integrated circuits > Testing

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