Cover Image

Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : January 28-30, 1997, Four Seasons Hotel, Austin, Texas, USA.

Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium Austin, Tex., IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: [New York] : Piscataway, NJ : Institute of Electrical and Electronics Engineers ; IEEE Service Center, ©1997.
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Semi-conducteurs > Propriétés thermiques > Congrès.
Semi-conducteurs > Refroidissement > Congrès.
Semiconductors > Cooling
Semiconductors > Thermal properties
Semiconducteurs > Propriétés thermiques > Congrès.
Systèmes électroniques > Propriétés thermiques > Congrès.
Conference papers and proceedings
Online Access:IEEE Xplore
IEEE Xplore
Description
Item Description:"IEEE catalog number 97CH36031"--Title page verso
Physical Description:xvi, 291 pages : illustrations ; 28 cm
Also available via the World Wide Web with additional title: Semiconductor Thermal Measurement and Management Symposium, 1997, SEMI-THERM XIII, Thirteenth Annual IEEE.
Bibliography:Includes bibliographical references.
ISBN:078033793X
9780780337930
0780337948
9780780337947
0780337956
9780780337954