Thirteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : January 28-30, 1997, Four Seasons Hotel, Austin, Texas, USA.

Bibliographic Details
Corporate Authors:	IEEE Semiconductor Thermal Measurement and Management Symposium Austin, Tex., IEEE Components, Hybrids, and Manufacturing Technology Society
Format:	Conference Proceeding Book
Language:	English
Published:	[New York] : Piscataway, NJ : Institute of Electrical and Electronics Engineers ; IEEE Service Center, ©1997.
Subjects:	Semiconductors > Thermal properties > Congresses. Semiconductors > Cooling > Congresses. Semi-conducteurs > Propriétés thermiques > Congrès. Semi-conducteurs > Refroidissement > Congrès. Semiconductors > Cooling Semiconductors > Thermal properties Semiconducteurs > Propriétés thermiques > Congrès. Systèmes électroniques > Propriétés thermiques > Congrès. Conference papers and proceedings
Online Access:	IEEE Xplore IEEE Xplore

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