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International Integrated Reliability Workshop final report.

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Bibliographic Details
Corporate Authors: International Integrated Reliability Workshop, IEEE Electron Devices Society, IEEE Reliability Society
Format: Conference Proceeding
Language:English
Published: [Piscataway, N.J.] : The Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, Inc.
Subjects:
Integrated circuits > Reliability > Congresses.
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Conference Proceeding
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