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International Integrated Reliability Workshop final report.

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Bibliographic Details
Corporate Authors: International Integrated Reliability Workshop, IEEE Electron Devices Society, IEEE Reliability Society
Format: Conference Proceeding
Language:English
Published: [Piscataway, N.J.] : The Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, Inc.
Subjects:
Integrated circuits > Reliability > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .I583
Notes: Subscription converted to electronic format.
Library Owns: TK7874 .I583 (1994-2003)
Call Number Status Get It
TK7874 .I583 1996 Available
TK7874 .I583 1995 Available
TK7874 .I583 1999 Available
TK7874 .I583 1998 Available
TK7874 .I583 1994 Available
TK7874 .I583 1997 Available
TK7874 .I583 2000 Available
TK7874 .I583 2001 Available
TK7874 .I583 2002 Available
TK7874 .I583 2003 Available