International Integrated Reliability Workshop final report.

Microelectronics manufacturing, yield, and reliability : 20-21 October 1994, Austin, Texas /
Published: (1994)

Electronics reliability and measurement technology : nondestructive evaluation /
Published: (1988)

Hybrid microcircuit reliability data /
Published: (1976)

Microcircuit device reliability : memory/digital LSI, winter 1981/82 /
by: Dey, Kieron A., et al.
Published: (1981)

Guidebook for managing silicon chip reliability /
by: Pecht, Michael
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VLSI reliability /
by: Sabnis, Anant G.
Published: (1990)

Failure-free integrated circuit packages : systematic elimination of failures through reliability engineering, failure analysis, and material improvements /
Published: (2004)

Rapid reliability assessment of VLSICs /
Published: (1990)

Integrated circuit quality and reliability /
by: Hnatek, Eugene R.
Published: (1995)

Yield and variability optimization of integrated circuits /
by: Zhang, J. C., 1963-
Published: (1995)

Reliability of RoHS-Compliant 2D and 3D IC interconnects /
by: Lau, John H.
Published: (2011)

Hot-carrier reliability of MOS VLSI circuits /
by: Leblebici, Yusuf
Published: (1993)

Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development /
by: Kuo, Way, 1951-
Published: (1998)

Electronics reliability and measurement technology : nondestructive evaluation /
Published: (1988)

Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development /
by: Kuo, Way, 1951-
Published: (1998)

Metallization : performance and reliability issues for VLSI and ULSI : 12-13 September 1991, San Jose, California /
Published: (1991)

Statistical performance modeling and optimization /
by: Li, Xin
Published: (2007)

Manufacturing yield evaluation of VLSI/WSI systems /
Published: (1995)

Multilevel interconnect technology /
by: Rao, Gopal K.
Published: (1993)

IEEE international reliability physics proceedings /
Published: (1994)

Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A. /
Published: (2007)

Reliability physics 1980 : 18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980 /
Published: (1980)

Electronics reliability and measurement technology : nondestructive evaluation /
Published: (1988)

IEEE International Reliability Physics Symposium proceedings /
Published: (1997)

Integrated circuit engineering : establishing a foundation /
by: Herbst, L. J.
Published: (1996)

Reliability physics.
Published: (1993)

Integrated circuit metrology, inspection, and process control VII : 2-4 March 1993, San Jose, California /
Published: (1993)

Proceedings of the ... International Symposium on the Physical & Failure Analysis of Integrated Circuits.

Developments in integrated circuit testing /
Published: (1987)

Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California /
Published: (1985)

International encyclopedia of integrated circuits /
by: Gibilisco, Stan
Published: (1992)

Wafer scale integration, III : proceedings of the Third IFIP WG 10.5 Workshop on Wafer Scale Integration, Como, Italy, 6-8 June 1989 /
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Proceedings of the 1984 Custom Integrated Circuits Conference : Genesee Plaza/Holiday Inn, Rochester NY, May 21-23, 1984.
Published: (1984)

Integrated circuit fabrication /
by: Shubham, Kumar, et al.
Published: (2021)

Linear integrated networks: design /
by: Moschytz, George S.
Published: (1975)

Integrated circuit metrology, inspection, and process control III, 27-28 February 1989, Los Angeles, California /
Published: (1989)