Improvement of SRAM-based failure analysis calibrated IDDQ testing /

be able to meet with the continuous increasing demand in

Bibliographic Details
Main Author: Balachandran, Hariharan
Format: Thesis eBook
Language:English
Published: [Place of publication not identified] : [publisher not identified] ; 1996.
Subjects:
Online Access:Link to OAKTrust copy

Internet

Link to OAKTrust copy

Cushing: Theses & Dissertations Microforms (Does not check out)

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Call Number: 1996 Thesis B353
 
Call Number Status Get It
1996 Thesis B353 Available

Available Online

Holdings details from Available Online
Call Number: 1996 Thesis B353
 
Call Number Status Get It
1996 Thesis B353 Available