Statistical approach to VLSI /

Bibliographic Details
Other Authors:	Director, Stephen W., Maly, W.
Format:	Book
Language:	English
Published:	Amsterdam ; New York : North-Holland, 1994.
Series:	Advances in CAD for VLSI ; v. 8.
Subjects:	Integrated circuits > Very large scale integration > Defects. Integrated circuits > Very large scale integration > Design and construction > Statistical methods. Mathematical optimization. Integrated circuits > Design

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