Surveillance and assessment technologies for law enforcement : 19-20 November 1996, Boston, Massachusetts /

Bibliographic Details
Corporate Authors:	National Institute of Standards and Technology (U.S.), National Institute of Justice (U.S.), Society of Photo-optical Instrumentation Engineers
Other Authors:	DePersia, A. Trent, Yeager, Suzan, Ortiz, Steve
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1997]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2935.
Subjects:	Law enforcement > Technological innovations > Congresses. Electronics in criminal investigation > Congresses. Forensic sciences > Congresses.

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