Three-dimensional imaging and laser-based systems for metrology and inspection II : 20-21 November 1996, Boston, Massachusetts /
| Corporate Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[1997]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2909. |
| Subjects: |
| Physical Description: | vii, 262 pages : illustrations ; 28 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819423114 |