Three-dimensional imaging and laser-based systems for metrology and inspection II : 20-21 November 1996, Boston, Massachusetts /
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[1997]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 2909. |
| Subjects: |
Remote Storage
| Call Number: |
TK8315 .T47 1997 |
|
|---|---|---|
| Call Number | Status | Get It |
| TK8315 .T47 1997 | Available | |