Proceedings : International Test Conference 1996.

Bibliographic Details
Corporate Authors:	International Test Conference Washington, D.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Altoona, Pa. : The Conference, ©1996.
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Integrated circuits > Fault tolerance > Congresses. Circuits intégrés > Tolérance aux fautes > Congrès. Electronic digital computers > Circuits > Testing. Integrated circuits > Fault tolerance. Integrated circuits > Testing. Circuits intégrés > Essais > Congrès. Conference papers and proceedings.
Online Access:	IEEE Xplore IEEE Xplore Table of contents

Description
Item Description:	"Sponsored by IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section"--Cover. "October 20-25, 1996 ... Washington, D.C., USA"--Cover. "IEEE catalog number 96CH35976"--Title page verso.
Physical Description:	xii, 951 pages : illustrations ; 29 cm Also available via the World Wide Web with additional title: Test Conference, 1996, proceedings, International.
Bibliography:	Includes bibliographical references and index.
ISBN:	0780335414 9780780335417 0780335406 9780780335400 0780335422 9780780335424 0780335430 9780780335431