Proceedings : International Test Conference 1996.

Bibliographic Details
Corporate Authors:	International Test Conference Washington, D.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Altoona, Pa. : The Conference, ©1996.
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Integrated circuits > Fault tolerance > Congresses. Circuits intégrés > Tolérance aux fautes > Congrès. Electronic digital computers > Circuits > Testing. Integrated circuits > Fault tolerance. Integrated circuits > Testing. Circuits intégrés > Essais > Congrès. Conference papers and proceedings.
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