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Proceedings of the ... European Symposium on Reliability of Electron Devices, Failure Physics and Analyses.

Bibliographic Details
Corporate Authors: European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society
Format: Conference Proceeding
Language:English
Published: Oxford : Elsevier.
Subjects:
Electronic apparatus and appliances > Reliability > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Integrated circuits > Reliability > Congresses.
Integrated circuits > Testing > Congresses.
Description
Item Description:Description based on: 7th (8-11 Oct. 1996).
Volume for 1996 issued as volume 36, number 11/12 of: Microelectronics and reliability.
Physical Description:volumes : illustrations ; 30 cm.
Publication Frequency:Annual