Proceedings of the ... European Symposium on Reliability of Electron Devices, Failure Physics and Analyses.

Bibliographic Details
Corporate Authors:	European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society
Format:	Conference Proceeding
Language:	English
Published:	Oxford : Elsevier.
Subjects:	Electronic apparatus and appliances > Reliability > Congresses. Electronic apparatus and appliances > Testing > Congresses. Integrated circuits > Reliability > Congresses. Integrated circuits > Testing > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number	Status	Get It
Call Number:		TK7870 .E86
Notes:		Subscription converted to electronic format.
Library Owns: TK7870 .E86		(7th,11th (1996,2000))
TK7870 .E86 7th 1996	Available
TK7870 .E86 11th 2000	Available