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Characterization methods for submicron MOSFETs /

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Bibliographic Details
Other Authors: Haddara, Hisham
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1995]
Series:Kluwer international series in engineering and computer science ; SECS 352.
Kluwer international series in engineering and computer science. Analog circuits and signal processing.
Subjects:
Metal oxide semiconductor field-effect transistors > Mathematical models.
Electronic circuit design.
Transistors
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Characterization Methods for Submicron MOSFETs /
by Haddara, Hisham
Published 1996
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