Characterization methods for submicron MOSFETs /

Bibliographic Details
Other Authors:	Haddara, Hisham
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [1995]
Series:	Kluwer international series in engineering and computer science ; SECS 352. Kluwer international series in engineering and computer science. Analog circuits and signal processing.
Subjects:	Metal oxide semiconductor field-effect transistors > Mathematical models. Electronic circuit design. Transistors

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