Characterization methods for submicron MOSFETs /
| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
Boston :
Kluwer Academic Publishers,
[1995]
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| Series: | Kluwer international series in engineering and computer science ;
SECS 352. Kluwer international series in engineering and computer science. Analog circuits and signal processing. |
| Subjects: |
| Physical Description: | vii, 232 pages : illustrations ; 24 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0792396952 (acid-free paper) |