Digest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C. /

Bibliographic Details
Corporate Authors:	IEEE International Workshop on IDDQ Testing Washington, D.C., IEEE Computer Society. Test Technology Technical Committee
Other Authors:	Tong, Carol, Jayasumana, Anura P.
Format:	Conference Proceeding Book
Language:	English
Published:	Los Alamitos, Calif. : IEEE Computer Society Press, [1996]
Subjects:	Iddq testing > Congresses. Metal oxide semiconductors, Complementary > Testing > Congresses.

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