Cover Image

Conference record : Autotestcon '96 : test technology and commercialization, September 16-19, 1996, Dayton, Ohio /

Bibliographic Details
Corporate Authors: Autotestcon '96 Dayton, Ohio, Institute of Electrical and Electronics Engineers, IEEE Aerospace and Electronic Systems Society, IEEE Instrumentation and Measurement Society
Format: Conference Proceeding Book
Language:English
Published: [New York, N.Y.] : Piscataway, N.J. : Institute of Electrical and Electronics Engineers ; IEEE Service Center, [1996]
Subjects:
Systems engineering > Congresses.
Description
Item Description:"IEEE catalog number 96CH35955"--Title page verso.
Physical Description:488 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0780333802 (casebound)
0780333799 (softbound)
0780333810 (microfiche)