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Conference record : Autotestcon '96 : test technology and commercialization, September 16-19, 1996, Dayton, Ohio /

Bibliographic Details
Corporate Authors: Autotestcon '96 Dayton, Ohio, Institute of Electrical and Electronics Engineers, IEEE Aerospace and Electronic Systems Society, IEEE Instrumentation and Measurement Society
Format: Conference Proceeding Book
Language:English
Published: [New York, N.Y.] : Piscataway, N.J. : Institute of Electrical and Electronics Engineers ; IEEE Service Center, [1996]
Subjects:
Systems engineering > Congresses.

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Call Number: TK7895.A8 A98 1996
 
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TK7895.A8 A98 1996 Available