Micromachined devices and components II : 14-15 October, 1996, Austin, Texas /

Bibliographic Details
Corporate Authors:	Semiconductor Equipment and Materials International, Society of Photo-optical Instrumentation Engineers, National Institute of Standards and Technology (U.S.)
Other Authors:	Chau, Kevin, Roop, Ray
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1996]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2882.
Subjects:	Microelectromechanical systems > Congresses. Micromachining > Congresses.

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