Cover Image

Proceedings : International Conference on the Economics of Design, Test, and Manufacturing /

Bibliographic Details
Corporate Authors: International Conference on the Economics of Design, Test, and Manufacturing, IEEE Computer Society. Test Technology Technical Committee
Format: Conference Proceeding
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society Press.
Subjects:
Electronic circuits > Testing > Congresses.
Electronic circuit design > Congresses.
Description
Item Description:Description based on: 3rd (May 16-17, 1994).
Title from cover.
Physical Description:volumes : illustrations ; 29 cm.