Proceedings : International Conference on the Economics of Design, Test, and Manufacturing /

Bibliographic Details
Corporate Authors:	International Conference on the Economics of Design, Test, and Manufacturing, IEEE Computer Society. Test Technology Technical Committee
Format:	Conference Proceeding
Language:	English
Published:	Los Alamitos, Calif. : IEEE Computer Society Press.
Subjects:	Electronic circuits > Testing > Congresses. Electronic circuit design > Congresses.

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