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Quantitative X-ray diffractometry /

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Bibliographic Details
Main Author: Zevin, Lev S.
Other Authors: Kimmel, Giora, Mureinik, Inez
Format: Book
Language:English
Published: New York : Springer, [1995]
Subjects:
X-rays > Diffraction.
X-rays > Diffraction > Industrial applications.
Description
Physical Description:xvii, 372 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages 355-364) and index.
ISBN:0387945415 (hc : alk. paper)