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Quantitative X-ray diffractometry /

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Bibliographic Details
Main Author: Zevin, Lev S.
Other Authors: Kimmel, Giora, Mureinik, Inez
Format: Book
Language:English
Published: New York : Springer, [1995]
Subjects:
X-rays > Diffraction.
X-rays > Diffraction > Industrial applications.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QC482.D5 Z48 1995
 
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QC482.D5 Z48 1995 Available