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Digital systems testing and testable design /

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Bibliographic Details
Main Author: Abramovici, Miron
Other Authors: Breuer, Melvin A., Friedman, Arthur D.
Format: Book
Language:English
Published: Piscataway, NJ : IEEE Press, [1990]
Edition:Revised printing.
Subjects:
Digital integrated circuits > Testing.
Digital integrated circuits > Design and construction.
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by Abramovici, Miron
Published 1990
Book
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