Digital systems testing and testable design /

Bibliographic Details
Main Author:	Abramovici, Miron
Other Authors:	Breuer, Melvin A., Friedman, Arthur D.
Format:	Book
Language:	English
Published:	Piscataway, NJ : IEEE Press, [1990]
Edition:	Revised printing.
Subjects:	Digital integrated circuits > Testing. Digital integrated circuits > Design and construction.

Evans: Library Stacks