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Digital systems testing and testable design /

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Bibliographic Details
Main Author: Abramovici, Miron
Other Authors: Breuer, Melvin A., Friedman, Arthur D.
Format: Book
Language:English
Published: Piscataway, NJ : IEEE Press, [1990]
Edition:Revised printing.
Subjects:
Digital integrated circuits > Testing.
Digital integrated circuits > Design and construction.
Description
Item Description:"This is the IEEE revised printing of the book previously published by W. H. Freeman and Company in 1990 under the title Digital systems testing and testable design"--verso.
Physical Description:xviii, 652 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0780310624