Using functional representation in the reducing ATPG search /

Major advances in VLSI technology over the past ten years has made the problem of fault detection for circuits more difficult. As these circuits increase in size, the demand for a highly efficient Automatic Test Pattern Generation algorithm exists. The problem for most ATPG algorithms is in minimi...

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Bibliographic Details

Main Author:	Bauerschmidt, Brian James, 1967-
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1993.
Subjects:	Major electrical engineering.
Online Access:	Link to OAKTrust copy