Surface analysis with STM and AFM : experimental and theoretical aspects of image analysis /
| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Weinheim ; New York :
VCH,
1996.
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| Subjects: |
Evans: Library Stacks
| Call Number: |
QH212.S35 M3 1996 |
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|---|---|---|
| Call Number | Status | Get It |
| QH212.S35 M3 1996 | Available | |
Evans: Library Stacks
| Call Number: |
Added copy on order |
|
|---|---|---|
| Call Number | Status | Get It |
| Added copy on order | Available | |