Testability concepts for digital ICs : the macro test approach /

Bibliographic Details
Main Author:	Beenker, F. P. M. (Frans P. M.)
Other Authors:	Bennetts, R. G., Thijssen, A. P.
Format:	Book
Language:	English
Published:	Dordrecht ; Boston : Kluwer Academic Publishers, [1995]
Series:	Frontiers in electronic testing ; 3.
Subjects:	Digital integrated circuits > Testing. Automatic test equipment.

Description
Physical Description:	ix, 212 pages : illustrations ; 25 cm.
Bibliography:	Includes bibliographical references (pages 197-205) and index.
ISBN:	0792396588 (hardcover : alk. paper)