Testability concepts for digital ICs : the macro test approach /

Bibliographic Details
Main Author:	Beenker, F. P. M. (Frans P. M.)
Other Authors:	Bennetts, R. G., Thijssen, A. P.
Format:	Book
Language:	English
Published:	Dordrecht ; Boston : Kluwer Academic Publishers, [1995]
Series:	Frontiers in electronic testing ; 3.
Subjects:	Digital integrated circuits > Testing. Automatic test equipment.

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