X-ray and EUV/FUV spectroscopy and polarimetry : 11-12 July, 1995, San Diego, California /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Fineschi, Silvano
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1995]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2517.
Subjects:	X-ray spectroscopy > Congresses. Ultraviolet spectroscopy > Congresses. Astronomical spectroscopy > Congresses. Polarimetry > Congresses.

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