Cover Image

Proceedings /

Bibliographic Details
New Title:IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. Proceedings
Previous Title:Defect and fault tolerance in VLSI systems
Corporate Authors: International Workshop on Defect and Fault Tolerance in VLSI Systems, IEEE Computer Society, IEEE Computer Society. Fault-Tolerant Computing Technical Committee
Format: Conference Proceeding
Language:English
Published: Los Alamitos, CA : IEEE Computer Society Press, 1991-
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Integrated circuits > Fault tolerance > Congresses.
Online Availability: Check for online availability
Description
Published:1991-1995.
Physical Description:5 volumes : illustrations ; 23 cm.
Publication Frequency:Annual
ISSN:1063-6722
1055-9329