Proceedings /

Bibliographic Details
New Title:	IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. Proceedings
Previous Title:	Defect and fault tolerance in VLSI systems
Corporate Authors:	International Workshop on Defect and Fault Tolerance in VLSI Systems, IEEE Computer Society, IEEE Computer Society. Fault-Tolerant Computing Technical Committee
Format:	Conference Proceeding
Language:	English
Published:	Los Alamitos, CA : IEEE Computer Society Press, 1991-
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Congresses. Integrated circuits > Fault tolerance > Congresses.
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