Properties of strained and relaxed silicon germanium /

Bibliographic Details
Corporate Authors:	Institution of Electrical Engineers, INSPEC (Information service)
Other Authors:	Kasper, Erich
Format:	Book
Language:	English
Published:	London : INSPEC, [1995]
Series:	EMIS datareviews series ; no. 12.
Subjects:	Germanium alloys > Structure. Silicon alloys > Structure. Semiconductors. Heterostructures. Superlattices as materials.

Description
Item Description:	On title page: IEE.
Physical Description:	xiv, 232 pages : illustrations ; 29 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0852968264