Properties of strained and relaxed silicon germanium /

Bibliographic Details
Corporate Authors:	Institution of Electrical Engineers, INSPEC (Information service)
Other Authors:	Kasper, Erich
Format:	Book
Language:	English
Published:	London : INSPEC, [1995]
Series:	EMIS datareviews series ; no. 12.
Subjects:	Germanium alloys > Structure. Silicon alloys > Structure. Semiconductors. Heterostructures. Superlattices as materials.

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