Cover Image

Improved repairability/unrepairability detection for yield enhancement of WSI memories with redundancy /

Bibliographic Details
Main Author: Shen, Y.-N
Other Authors: Lombardi, Fabrizio, 1955-
Format: Book
Language:English
Published: College Station, Tex. : Texas A & M University, Computer Science Dept., 1988.
Series:Technical report (Texas A & M University. Computer Science Department) ; 88-016.
Subjects:
Integrated circuits > Wafer-scale integration.

Remote Storage

Holdings details from Remote Storage
Call Number: QA76 .C656 88-016
 
Call Number Status Get It
QA76 .C656 88-016 Available

Cushing: Texas A&M (Does not check out)

Holdings details from Cushing: Texas A&M (Does not check out)
Call Number: QA76 .C656 88-016
 
Call Number Status Get It
QA76 .C656 88-016 Available