Integrating photogrammetric techniques with scene analysis and machine vision II : 19-21 April 1995, Orlando, Florida /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Dowman, Ian J., McKeown, David M.
Format:	Book
Language:	English
Published:	Bellingham, Wash. : SPIE, [1995]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 2486.
Subjects:	Computer vision > Congresses. Photogrammetry > Congresses. Cartography > Congresses.

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