GLFSR : a new pseudo-random test pattern generator /
Abstract: "A new pseudo-random test pattern generator is introduced here. Based on the generalized representation of the linear feedback shift registers (LFSR), GLFSRs already have demonstrated suitability for signature analysis in built-in-self-testing, BIST applications. Use of these GLFSRs...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
College Station, Tex. :
Texas A & M University, Computer Science Dept.,
[1993]
|
| Series: | Technical report (Texas A & M University. Computer Science Department) ;
93-050. |
| Subjects: |
| Summary: | Abstract: "A new pseudo-random test pattern generator is introduced here. Based on the generalized representation of the linear feedback shift registers (LFSR), GLFSRs already have demonstrated suitability for signature analysis in built-in-self-testing, BIST applications. Use of these GLFSRs is proposed here as test pattern generators for both exhaustive testing as well as random pattern testing. It is shown how GLFSRs can be implemented, and how to estimate the cost of their implementation. With established criterion, the 'randomness' of the sequences generated by the GLFSR have been studied, tests demonstrating the effectiveness of GLFSRs as 'good' random pattern generators. It is also demonstrated how to select the most appropriate GLFSR for a particular application. Further, the fault coverage achieved by the patterns generated by the GLFSRs is evaluated and compared with traditional LFSRs, using a number of ISCAS benchmark circuits. Clearly demonstrated is that the GLFSR outperforms all other conventional pseudo- random pattern generators." |
|---|---|
| Physical Description: | 19 leaves : illustrations ; 28 cm. |
| Bibliography: | Includes bibliographical references. |