GLFSR : a new pseudo-random test pattern generator /

Abstract: "A new pseudo-random test pattern generator is introduced here. Based on the generalized representation of the linear feedback shift registers (LFSR), GLFSRs already have demonstrated suitability for signature analysis in built-in-self-testing, BIST applications. Use of these GLFSRs...

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Bibliographic Details

Main Author:	Chatterjee, Mitrajit
Other Authors:	Pradhan, Dhiraj K.
Format:	Book
Language:	English
Published:	College Station, Tex. : Texas A & M University, Computer Science Dept., [1993]
Series:	Technical report (Texas A & M University. Computer Science Department) ; 93-050.
Subjects:	Fault-tolerant computing.