Influence of temperature on microelectronics and system reliability /
| Main Author: | Lall, Pradeep |
|---|---|
| Other Authors: | Pecht, Michael, Hakim, Edward B. |
| Format: | Book |
| Language: | English |
| Published: |
Boca Raton, Fla. :
CRC Press,
[1997]
|
| Series: | Electronic packaging series.
|
| Subjects: |
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