Influence of temperature on microelectronics and system reliability /

Bibliographic Details
Main Author:	Lall, Pradeep
Other Authors:	Pecht, Michael, Hakim, Edward B.
Format:	Book
Language:	English
Published:	Boca Raton, Fla. : CRC Press, [1997]
Series:	Electronic packaging series.
Subjects:	Microelectronics > Materials > Thermal properties. Electronic packaging. Electronic apparatus and appliances > Reliability.

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