Influence of temperature on microelectronics and system reliability /

Bibliographic Details
Main Author: Lall, Pradeep
Other Authors: Pecht, Michael, Hakim, Edward B.
Format: Book
Language:English
Published: Boca Raton, Fla. : CRC Press, [1997]
Series:Electronic packaging series.
Subjects:

MARC

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035 |a (OCoLC)35657869 
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245 1 0 |a Influence of temperature on microelectronics and system reliability /  |c Pradeep Lall, Michael G. Pecht, Edward B. Hakim. 
264 1 |a Boca Raton, Fla. :  |b CRC Press,  |c [1997] 
264 4 |c ©1997 
300 |a 307 pages :  |b illustrations ;  |c 26 cm. 
336 |a text  |b txt  |2 rdacontent 
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490 1 |a Electronic packaging series 
504 |a Includes bibliographical references and index. 
650 0 |a Microelectronics  |x Materials  |x Thermal properties. 
650 0 |a Electronic packaging. 
650 0 |a Electronic apparatus and appliances  |x Reliability. 
700 1 |a Pecht, Michael. 
700 1 |a Hakim, Edward B. 
830 0 |a Electronic packaging series. 
999 |a MARS 
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952 f f |p normal  |a Texas A&M University  |b College Station  |c Sterling C. Evans Library  |d Evans: Library Stacks  |t 0  |e TK7870.25 .L35 1997  |h Library of Congress classification  |i unmediated -- volume  |m A14821170207 
998 f f |a TK7870.25 .L35 1997  |t 0  |l Evans: Library Stacks