Influence of temperature on microelectronics and system reliability /

Bibliographic Details
Main Author:	Lall, Pradeep
Other Authors:	Pecht, Michael, Hakim, Edward B.
Format:	Book
Language:	English
Published:	Boca Raton, Fla. : CRC Press, [1997]
Series:	Electronic packaging series.
Subjects:	Microelectronics > Materials > Thermal properties. Electronic packaging. Electronic apparatus and appliances > Reliability.

Description
Physical Description:	307 pages : illustrations ; 26 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0849394503 (acid-free paper)