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Yield and variability optimization of integrated circuits /

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Bibliographic Details
Main Author: Zhang, J. C., 1963-
Other Authors: Styblinski, M. A., 1942-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1995]
Subjects:
Integrated circuits > Design and construction > Statistical methods.
Integrated circuits > Reliability.
Integrated circuits > Defects.
Description
Physical Description:xv, 234 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages 221-231) and index.
ISBN:0792395514 (acid-free paper)