Yield and variability optimization of integrated circuits /

Bibliographic Details
Main Author:	Zhang, J. C., 1963-
Other Authors:	Styblinski, M. A., 1942-
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [1995]
Subjects:	Integrated circuits > Design and construction > Statistical methods. Integrated circuits > Reliability. Integrated circuits > Defects.

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