Monte Carlo modeling for electron microscopy and microanalysis /

Bibliographic Details
Main Author:	Joy, David C., 1943-
Format:	Book
Language:	English
Published:	New York : Oxford University Press, 1995.
Series:	Oxford series in optical and imaging sciences ; 9.
Subjects:	Electron microscopy > Computer simulation. Electron probe microanalysis > Computer simulation. Monte Carlo method.

Description
Physical Description:	viii, 216 pages : illustrations ; 24 cm
Bibliography:	Includes bibliographical references.
ISBN:	0195088743